Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-10
2009-02-03
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S019000
Reexamination Certificate
active
07487482
ABSTRACT:
The method evaluates a constraint of a sequential memory cell able to sample an input data item regulated by a clock signal. The constraint is dependent on the ramp of a first signal and on the ramp of a second signal. The method includes a characterization phase including a first step of determination in which a value of the second ramp is fixed, the value of the first ramp is made to vary so as to determine, a first set of values of the constraint. A second step of determination includes the value of the first ramp being fixed at one of its values taken during the first step of determination, the value of the second ramp is made to vary so as to determine for each value of the second ramp a deviation with respect to the value of the constraint belonging to the first set and corresponding to the fixed value of the first ramp. The method includes a third step of calculation in which the values of the constraint are calculated for all the values of the first ramp and of the second ramp, while adding the various deviations obtained to the values of the first set of values.
REFERENCES:
patent: 5559715 (1996-09-01), Misheloff
patent: 6311148 (2001-10-01), Krishnamoorthy
patent: 6640330 (2003-10-01), Joshi
patent: 6732066 (2004-05-01), Krishnamoorthy
patent: 2003/0204818 (2003-10-01), Kashyap
patent: 2003/0212972 (2003-11-01), Tran
patent: 2004/0199888 (2004-10-01), Katla et al.
Lasbouygues Benoit
Schindler Joël
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Garbowski Leigh Marie
Jorgenson Lisa K.
STMicroelectronics SA
LandOfFree
Method and system for evaluating a constraint of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for evaluating a constraint of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for evaluating a constraint of a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4097567