Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-12
2005-07-12
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C702S120000, C714S724000
Reexamination Certificate
active
06918099
ABSTRACT:
A microelectronic device design verification system and method estimates the entropy of stimuli communicated over an interface to verify a microelectronic device design and feeds back the estimated entropy to alter the generation of stimuli to improve the design state space verified by additional stimuli applied to the microelectronic device design. For instance, predetermined factors used for random or directed generation of stimuli are altered based on the estimated entropy of stimuli communicated over an interface to a microelectronic device design software model or hardware integrated circuit implementation. The predetermined factors are adjusted so that subsequent stimuli has a desired impact on the estimated entropy, such as an increase in entropy that indicates a more complete microelectronic device design verification.
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Hamilton & Terrile LLP
Holland Robert W.
Rossoshek Helen
Sun Microsystems Inc.
Thompson A. M.
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