Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-08-13
2011-12-06
Lu, Tom Y (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C460S007000, C377S006000
Reexamination Certificate
active
08073235
ABSTRACT:
A method of evaluating one or more kernels of an ear of maize using digital imagery includes acquiring a digital image of the one or more kernels of the ear of maize, processing the digital image to estimate at least one physical property of the one or more kernels of the ear of maize from the digital image, and evaluating the at least one kernel of maize using the estimate of the at least one physical property of the at least one kernel of maize.
REFERENCES:
patent: 5518454 (1996-05-01), Twilley et al.
patent: 5659623 (1997-08-01), Conrad
patent: 5764819 (1998-06-01), Orr et al.
patent: 5835206 (1998-11-01), Tragesser
patent: 6212824 (2001-04-01), Orr et al.
patent: 6418180 (2002-07-01), Weiss
patent: 6567537 (2003-05-01), Anderson
patent: 7123750 (2006-10-01), Lu et al.
patent: 2003/0072484 (2003-04-01), Kokko et al.
patent: 2003/0142852 (2003-07-01), Lu et al.
patent: 2005/0074146 (2005-04-01), Jones et al.
patent: 2006/0068372 (2006-03-01), Jones, III
patent: 04145309 (1992-05-01), None
PCT/US2008/009433 International Search Report.
Jia J., “Seed maize quality inspection with machine vision”, SPIE—Computer Vision for Industry, vol. 2989(288-295) 1993. Abstract XP002507235.
Pesaresi, Martino et al., “A New Approach for the Morphological Segmentation of High-Resolution Satellite Imagery”, IEEE Transactions on Geoscience and Remote Sensing, IEE Service Center, Pisctaway, NJ, US, vol. 39(2), Feb. 1, 2001. Abstract XP0011021693, ISSN:0196-2892.
Shyu, Chi-Ren et al., “Image Analysis for Mapping Immeasurable Phenotypes i Maize [Life Sciences]”, IEEE Signal Processing Magazine, IEEE Service Center, Piscataway, NJ, US, vol. 24(3):115-118 (May 1, 2007). Abstract XP011201392, ISSH:1053-5888.
Abadie Tabare E.
Cooper Mark
Hausmann Neil Jonathan
Lafitte Honor Renee
Schussler Jeffrey R.
Alston & Bird LLP
Lu Tom Y
Pioneer Hi-Bred International , Inc.
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