Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-11-10
2010-10-19
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C700S097000
Reexamination Certificate
active
07818708
ABSTRACT:
A method and system for processing geometrical layout design data to manufacture an electronic circuit is provided. The method includes extracting the geometrical layout design data from one or more data-format files. The method further includes segregating the geometrical layout design data extracted from one or more data-format files into each of a structural data, a spatial data, and a raw-geometry data. Thereafter, one or more predefined operations are performed on one or more of the structural data, the spatial data, and the raw-geometry data.
REFERENCES:
patent: 5530372 (1996-06-01), Lee et al.
patent: 7356374 (2008-04-01), Suttile et al.
patent: 7401319 (2008-07-01), Horng et al.
patent: 7546232 (2009-06-01), Brooks et al.
Global IP Services PLLC
Levin Naum B
Nama Prakash
SoftJin Technologies Private Limited
LandOfFree
Method and system for developing post-layout electronic data... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for developing post-layout electronic data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for developing post-layout electronic data... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4235276