Method and system for determining the location of a...

Details Method and system for determining the location of a... Method and system for determining the location of a...

2007-12-25

2007-12-25

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C702S155000, C702S172000, C374S126000, C374S128000, C219S121800, C219S121780

Reexamination Certificate

active

11048996

ABSTRACT:
According to one embodiment of the invention a method for determining the location of a potential defect in a device includes scanning a surface of the device with a temperature sensor while operating the device. The method also includes measuring a temperature of the device by a temperature sensor at a plurality of locations while scanning. Based upon the measured temperatures, a temperature profile is constructed for the device. The method also includes comparing the constructed temperature profile to a reference profile to determine a location of the potential defect in the device.

REFERENCES:
patent: 5907820 (1999-05-01), Pan
patent: 6095679 (2000-08-01), Hammiche et al.
patent: 6123766 (2000-09-01), Williams et al.
patent: 6566885 (2003-05-01), Pinto et al.
patent: 6747245 (2004-06-01), Talwar et al.

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