Method and system for designing an integrated circuit with...

Details Method and system for designing an integrated circuit with... Method and system for designing an integrated circuit with...

2007-04-10

2007-04-10

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

10778136

ABSTRACT:
Noise current flowing to the outside of an IC (1) with respect to the capacitance value and arrangement location of a bypass capacitor (4) is calculated on the basis of the impedance of current paths (P1, P2) passing via a bypass capacitor (4) at the outside of the IC (1) and the impedance of the inside of IC (1) when viewed from power supply terminals (2, 3) of the IC (1). The capacitance value and arrangement location of the bypass capacitor (4) are determined on the basis of the calculation result.

REFERENCES:
patent: 6054751 (2000-04-01), Ichikawa et al.
patent: 2004/0103381 (2004-05-01), Shinomiya
patent: A-2001-175702 (2001-06-01), None
patent: 1 143 507 (2001-10-01), None

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