Method and system for creating test component layouts

Details Method and system for creating test component layouts Method and system for creating test component layouts

2005-07-19

2005-07-19

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

06920620

ABSTRACT:
In a computer-implemented method and system for creating a test component layout, after creating a reference component layout that is composed of a set of polygonal working shapes, a plurality of shape parameters are defined for the working shapes of the reference component layout, and a parameter template is formed based on the shape parameters of the reference component layout. Thereafter, user-defined distance values corresponding to the shape parameters may be inputted into the parameter template, and the test component layout is automatically created by adjusting geometry of the working shapes of the reference component layout with reference to the user-defined distance values inputted into the parameter template.

REFERENCES:
patent: 6064806 (2000-05-01), Lakos et al.
patent: 6341366 (2002-01-01), Wang et al.
patent: 6457163 (2002-09-01), Yang
patent: 6480995 (2002-11-01), Schmidt et al.
patent: 6523162 (2003-02-01), Agrawal et al.

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