Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2004-12-21
2010-10-05
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07810061
ABSTRACT:
A method of determining a useful skew for a circuit design includes computing a slack value for each sequential cell in the circuit design, identifying modifiable sequential cells in the circuit design, and computing a target delay for each modifiable sequential cell. One or more sequential cells are discarded based on the slack values. A target slack value for each remaining sequential cell is determined. The remaining cells are sorted based on the target slack values to determine a minimum target slack value, and a delay for each cell is determined based on the minimum target slack value.
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Menguy Thomas
Minonne Salvatore D.
O'Sullivan Conor
Silve Francois
Cadence Design Systems Inc.
Dinh Paul
Sandoval Patrick
Vista IP Law Group LLP
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