Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents
Reexamination Certificate
2007-02-06
2008-12-09
Carrillo, Sharidan (Department: 1792)
Cleaning and liquid contact with solids
Processes
Using sequentially applied treating agents
C134S002000, C134S003000, C134S025400, C134S027000, C134S028000, C134S029000, C134S034000, C134S036000, C134S041000, C134S042000, C134S902000
Reexamination Certificate
active
07462248
ABSTRACT:
A method for cleaning a photomask includes cleaning the photomask with a chemical cleaner, introducing a solution to the photomask, the solution is configured to react with residuals generated from the chemical cleaner to form insoluble precipitates, and rinsing the photomask with a fluid to remove the insoluble precipitates from the photomask.
REFERENCES:
patent: 4569695 (1986-02-01), Yamashita et al.
patent: 6071376 (2000-06-01), Nagamura et al.
patent: 2002/0155360 (2002-10-01), Tange et al.
patent: 2003/0051740 (2003-03-01), Chao et al.
patent: 2007/0068558 (2007-03-01), Papanu et al.
Chang Ching-Yu
Chiu Chih-Cheng
Carrillo Sharidan
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
LandOfFree
Method and system for cleaning a photomask does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for cleaning a photomask, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for cleaning a photomask will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4031305