Method and system for characterizing electronic circuitry

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

11000140

ABSTRACT:
According to the invention a characteristic property of an electronic circuit component depending on at least one variable (X1, X2) is approximated by an approximating function. This is accomplished by dividing a total range of said least one variable into a number of sub-ranges by inserting dividing nodes (4), and approximating characterization data points (2) in each of the sub-ranges by an elementary function, wherein the elementary functions defined in the sub-ranges join together to form said approximating function defined in said total range. The approximation is accomplished such that the approximating function is continuously partial differentiable with respect to said at least one variable (X1, X2) in the dividing nodes (4).

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patent: 05012325 (1993-01-01), None
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Shingo Takeguchi, Hiromasa Suzuki, Kenji Shimada, Fumihiko Kimura and Takashi Kanai; Subdivision Surface Fitting With QEM-Based Mesh Simplification and Reconstruction of Approximated B-Spline Surfaces; The University of Tokyo Department of Precision Engineering; May 2000; pp. 202-212, p. 446.
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