Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-11-30
2008-10-07
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S002000
Reexamination Certificate
active
07434186
ABSTRACT:
Capacitance and inductance expressions used for modeling critical on-chip metal interconnects. A method for calculating high frequency limit capacitances C∞and inductances L∞of coplanar transmission line structures over silicon substrate utilizes field based expressions derived for a single coplanar T-line structures over silicon, and coupled coplanar T lines over silicon. For coupled coplanar structures, the field lines based calculation is performed separately for odd and even modes.
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Goren David
Sheinman Benny
Shlafman Shlomo
Erez, Esq. Suzanne
International Business Machines - Corporation
Scully , Scott, Murphy & Presser, P.C.
Siek Vuthe
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