Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-11
2011-01-11
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C703S013000, C703S014000
Reexamination Certificate
active
07870524
ABSTRACT:
A method and system for automating unit performance testing in integrated circuit design is disclosed. One embodiment of the present invention sets forth a method, which includes the steps of generating a first performance data for the unit to operate on a workload, embedding the first performance data in the workload for a register transfer level (RTL) implementation of the unit to operate on, and determining whether the expected performance of the unit is achieved based on the comparison between the first performance data and a second performance data, wherein the second performance data is generated after the RTL implementation of the unit operates on the workload.
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Alfieri Robert A.
Gharpure Prasad
Selvanesan Rajeshwaran
Tynefield, Jr. John Douglas
Nvidia Corporation
Patterson & Sheridan LLP
Rossoshek Helen
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