Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-18
2006-07-18
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07080331
ABSTRACT:
The invention relates to a method for automatic recognition of simulation configurations of integrated circuits under design comprising at least two components connected to one another directly or indirectly, for the functional verification of the integrated circuits through simulation tests. The method includes a step for the acquisition of a simulation configuration by a server manager, a step for the sending of a request by a client manager to the server manager, a step for sending a response by the server manager to the client manager, and a step for the comparison by the client manager of the response with the requirements of the test, followed by a step for the disabling, activation and/or modification of certain parts of the test by the client manager in order to adapt the test to the configuration or signaling an error if the test cannot be adapted to the configuration.
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Bull S.A.
Kondracki Edward J.
Lin Sun James
Miles & Stockbridge P.C.
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