Method and system for analyzing bitmap test data

Details Method and system for analyzing bitmap test data Method and system for analyzing bitmap test data

2005-01-11

2005-01-11

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S025000, C714S042000, C714S718000, C714S719000, C714S720000, C365S200000, C365S201000, C716S030000

Reexamination Certificate

active

06842866

ABSTRACT:
A system for analyzing bitmap test data includes a fault shape analyzer which continuously and automatically receives bitmap test data. In use, the user creates at least one failure pattern analysis order to be performed by the fault shape analyzer, the order specifying a particular failure pattern to be identified. Based on the order, the fault shape analyzer creates a bitmap display of a user-specified sector using selected bitmap test data. The fault shape analyzer identifies the user-specified failure pattern in the bitmap display by multiplying, at various locations, the bitmap display in the frequency domain and the failure pattern in the frequency domain. A comparison between the product of the multiplication process and the failure pattern is performed to locate failure patterns in the bitmap display. Failure patterns identified from the comparison process are saved as defect files which, in turn, are stored in a failure pattern classification database.

REFERENCES:
patent: 4736373 (1988-04-01), Schmidt
patent: 4876685 (1989-10-01), Rich
patent: 5588115 (1996-12-01), Augarten
patent: 5631868 (1997-05-01), Termullo et al.
patent: 5720031 (1998-02-01), Lindsay
patent: 5946214 (1999-08-01), Heavlin et al.
patent: 6091846 (2000-07-01), Lin et al.
patent: 6185707 (2001-02-01), Smith et al.
patent: 6330693 (2001-12-01), Lindsay

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