Method and system for analyzing bitmap test data

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S025000, C714S042000, C714S718000, C714S719000, C714S720000, C365S200000, C365S201000, C716S030000

Reexamination Certificate

active

06842866

ABSTRACT:
A system for analyzing bitmap test data includes a fault shape analyzer which continuously and automatically receives bitmap test data. In use, the user creates at least one failure pattern analysis order to be performed by the fault shape analyzer, the order specifying a particular failure pattern to be identified. Based on the order, the fault shape analyzer creates a bitmap display of a user-specified sector using selected bitmap test data. The fault shape analyzer identifies the user-specified failure pattern in the bitmap display by multiplying, at various locations, the bitmap display in the frequency domain and the failure pattern in the frequency domain. A comparison between the product of the multiplication process and the failure pattern is performed to locate failure patterns in the bitmap display. Failure patterns identified from the comparison process are saved as defect files which, in turn, are stored in a failure pattern classification database.

REFERENCES:
patent: 4736373 (1988-04-01), Schmidt
patent: 4876685 (1989-10-01), Rich
patent: 5588115 (1996-12-01), Augarten
patent: 5631868 (1997-05-01), Termullo et al.
patent: 5720031 (1998-02-01), Lindsay
patent: 5946214 (1999-08-01), Heavlin et al.
patent: 6091846 (2000-07-01), Lin et al.
patent: 6185707 (2001-02-01), Smith et al.
patent: 6330693 (2001-12-01), Lindsay

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for analyzing bitmap test data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for analyzing bitmap test data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for analyzing bitmap test data will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3383394

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.