Method and system for allowing a system under test (SUT) to...

Electrical computers and digital processing systems: support – Digital data processing system initialization or configuration – Loading initialization program

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C713S002000, C713S100000, C709S217000, C709S218000, C709S219000, C709S220000, C709S221000, C709S222000, C717S174000, C717S175000, C717S176000, C717S177000, C717S178000

Reexamination Certificate

active

10715961

ABSTRACT:
A computer manufacturing system is disclosed. The computer manufacturing system comprises a system under test (SUT), the SUT including a network adapter and a boot loader for loading the appropriate operating system. The SUT further includes a station for receiving customer orders for the SUT, the station including a sequencer. The sequencer obtains a boot selection file for the SUT from a directory. The SUT further retrieves and parses the boot selection file to obtain the operating system image to load and boot until the SUT is configured with the appropriate date. A system and method in accordance with the present invention provides a means for a computer being manufactured (hereinafter called a system under test, or SUT) to boot an operating system without the need for any local media. In addition, it allows the SUT to boot any one of several operating systems as required, depending on the tools being run during that portion of the process. The system in accordance with the present invention allows the operating system to be specified as an attribute of a manufacturing operation. The system in accordance with the present invention can switch between operating systems as required by the operations to be performed as specified by the appropriate personnel.

REFERENCES:
patent: 4868875 (1989-09-01), Goatman
patent: 5136705 (1992-08-01), Stubbs et al.
patent: 5901289 (1999-05-01), Leonard et al.
patent: 5948101 (1999-09-01), David et al.
patent: 6285967 (2001-09-01), Rajan et al.
patent: 6327706 (2001-12-01), Amberg et al.
patent: 6349341 (2002-02-01), Likes
patent: 6351769 (2002-02-01), King et al.
patent: 6370641 (2002-04-01), Maia
patent: 6473857 (2002-10-01), Panas et al.
patent: 6477486 (2002-11-01), Ram et al.
patent: 6499115 (2002-12-01), Wiedeman et al.
patent: 6557128 (2003-04-01), Turnquist
patent: 6560706 (2003-05-01), Carbajal et al.
patent: 6615406 (2003-09-01), Amberg et al.
patent: 6651093 (2003-11-01), Wiedeman et al.
patent: 6654347 (2003-11-01), Wiedeman et al.
patent: 6718373 (2004-04-01), Bearden et al.
patent: 6721762 (2004-04-01), Levine et al.
patent: 6807665 (2004-10-01), Evans et al.
patent: 6826710 (2004-11-01), Merkin et al.
patent: 6859925 (2005-02-01), Lin
patent: 6910064 (2005-06-01), Astarabadi et al.
patent: 6973564 (2005-12-01), Merkin et al.
patent: 7000231 (2006-02-01), Gold
patent: 7039682 (2006-05-01), Baitinger et al.
patent: 7047403 (2006-05-01), Lin
patent: 7062645 (2006-06-01), Kroening
patent: 7085921 (2006-08-01), Frye, Jr.
patent: 7093124 (2006-08-01), Girard
patent: 2002/0162059 (2002-10-01), McNeely et al.
patent: 2002/0188514 (2002-12-01), Kritt et al.
patent: 2003/0028629 (2003-02-01), Amro et al.
patent: 2003/0046529 (2003-03-01), Loison et al.
patent: 2003/0208712 (2003-11-01), Louden et al.
patent: 2004/0199758 (2004-10-01), Meaney et al.
patent: 2005/0055688 (2005-03-01), Barajas et al.
patent: 2005/0066015 (2005-03-01), Dandekar et al.
patent: 2005/0198629 (2005-09-01), Vishwanath

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for allowing a system under test (SUT) to... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for allowing a system under test (SUT) to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for allowing a system under test (SUT) to... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3901939

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.