Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2005-11-29
2008-12-23
Baker, Stephen M (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S756000
Reexamination Certificate
active
07469368
ABSTRACT:
A method and system for a non-volatile memory (NVM) with multiple bits error correction and detection for improving production yield are provided. Forward error correction (FEC) operations and cyclic redundancy check (CRC) operations may be utilized in an NVM array integrated in a chip to correct errors in memory elements and detect remaining errors respectively. When remaining errors are detected, the memory element may be substituted by redundant memory elements in the NVM array. An erasure operation in the FEC may be utilized to correct errors when the error location is known. The NVM array may be partitioned into classes that may each have specified FEC operations and a specified priority to substitute memory elements by redundant memory elements. The FEC and CRC operations may be utilized to protect secure information stored in the NVM array by disabling the chip when errors are detected while reading the secure information.
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Chen Iue-Shuenn
Chen Xuemin
Lupu Mihai
Baker Stephen M
Broadcom Corporation
McAndrews Held & Malloy Ltd.
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