Method and structure for a high voltage junction field...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S401000

Reexamination Certificate

active

06900506

ABSTRACT:
A method for fabricating a junction field transistor for high-voltage applications. A lightly doped first epitaxial layer is formed on a highly doped substrate. A second epitaxial layer is deposited with a heavier dopant concentration than the first epitaxial layer. The second layer contains a control structure having a plurality of implanted gate regions and a source. A guard ring is formed to isolate the source and the control structure. The combination of the lightly doped first epitaxial layer and the guard ring enable the JFET to be operated with a breakdown voltage in excess of 100 volts. Multiple guard rings may be used to provide a breakdown voltage in excess of 150 volts.

REFERENCES:
patent: 3381188 (1968-04-01), Zuleeg et al.
patent: 4404575 (1983-09-01), Nishizawa
patent: 4419586 (1983-12-01), Phipps
patent: 4506282 (1985-03-01), Baliga
patent: 4519024 (1985-05-01), Federico et al.
patent: 4523111 (1985-06-01), Baliga
patent: 4645957 (1987-02-01), Baliga
patent: 4700461 (1987-10-01), Choi et al.
patent: 4750023 (1988-06-01), Shannon
patent: 4769685 (1988-09-01), MacIver et al.
patent: 4853561 (1989-08-01), Gravrok
patent: 5038266 (1991-08-01), Callen et al.
patent: 5396085 (1995-03-01), Baliga
patent: 5945699 (1999-08-01), Young
patent: 6011703 (2000-01-01), Boylan et al.
patent: 6028778 (2000-02-01), Amano
patent: 6064580 (2000-05-01), Watanabe et al.
patent: 6069809 (2000-05-01), Inoshita
patent: 6084792 (2000-07-01), Chen et al.
patent: 6090650 (2000-07-01), Dabrai et al.
patent: 6104172 (2000-08-01), Josephs et al.
patent: 6180519 (2001-01-01), Kuroi et al.
patent: 6236257 (2001-05-01), Si et al.
patent: 6251716 (2001-06-01), Yu
patent: 6307223 (2001-10-01), Yu
patent: 6404157 (2002-06-01), Simon
patent: 6439678 (2002-08-01), Norton
patent: 2002/0024056 (2002-02-01), Miyakoshi et al.
Kang et al.; “A New Type of Transistor: CBT”; IEEE Transactions on Electron Devices; vol. 40; #10; Oct. 93.
“N-Channel Enhancement-Mode MOSFET Transistors”; 2N6660JAN/JANTX/JANTXV; Product Summary; Siliconix; P-37515-Rev. A, Jul. 04, 1994.
General Semiconductor; GF2208; “N-Channel Enhancement-Mode MOSFET”; Jul. 10, 2001.
International Rectifier; IRF1205; HEXFET Power MOSFET; Nov. 03, 1999.
“N-Channel 30V-0.034Ω-22A D2PAK StripFET Power MOSFET”; STB22NE03L: Preliminary Data; 6 pgs.; Nov. 2000.
“N-Channel Enhancement-Mode MOSFET Transistors”; 2N66601/VN88AFD; Product Summary; Siliconix; P-37655-Rev. B, Jul. 25, 1994.
Central Semiconductor Corp.; CMPF4391, CMPF4392 CMPF4393, N-Channel JFET; Product Summary.
Fairchild Semiconductor Corporation; “N-Channel/Logic Level Enhancement Mode Field Effect Transistor”; FDP6030L/FDB6030L; Apr. 1998.
Philips Semiconductors; “PowerMOS Transistor”; BUK463-60A/B; Product Specification; Jul. 1995.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and structure for a high voltage junction field... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and structure for a high voltage junction field..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and structure for a high voltage junction field... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3456104

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.