Method and shunting and deshunting an electrical component and a

Details Method and shunting and deshunting an electrical component and a Method and shunting and deshunting an electrical component and a

1999-03-23

2000-11-14

McPherson, John A.

Radiation imagery chemistry: process, composition, or product th

Imaging affecting physical property of radiation sensitive...

Making electrical device

430311, 430945, 2960303, 2960307, 3602458, 21912185, G11B 511

Patent

active

061468134

ABSTRACT:
The present invention provides a method for the creation and removal of shunts for the prevention of ESD/EOS damage to electrical components. In one embodiment of the present invention, the conductive pathway is provided and removed by exposing the interconnect's carbonizable and ablatable substrate to a radiant energy source such as a laser beam. The present invention also provides for interconnects that include at least two conductive wires or leads engaged on at least one surface by a carbonizable and ablatable material. The conductive wires may each include a branched dead end lead portion interleaved with the branched dead end lead portion of the other. Alternatively, the conductive wires may extend in close proximity to each other in a curved or sinuous or serpentine or backtracking pattern. An interconnect in accord with the present invention may include a substrate substantially supporting the conductive wires except at predetermined locations or proposed shunt sites wherein there is at least one through hole in the substrate.

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H.M. Phillips, T. Feurer, S. P. LeBlanc, D.L. Callahan and R. Sauerbrey,m "Excimer Laser Induced Permanent Electrical Conductivity and Nanostructures in Polymers", Sep. 1993, published in SPIE vol. 1856 Laser Radiation Photophysics (1993), pp. 143-154.
H.M. Phillips, Yunjun Li, and Binglin Zhang, "Laser Induced Permanent Electrical Conductivity in Insulating Metal-Polymer Composites", Apr. 1996, published in SPIE vol. 2888, pp. 404-413.

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