Method and means for diagnostic testing of CCD memories

Details Method and means for diagnostic testing of CCD memories Method and means for diagnostic testing of CCD memories

1981-02-19

1983-10-11

Hecker, Stuart N.

Static information storage and retrieval

Read/write circuit

Testing

324158T, G11C 2900

Patent

active

044096763

ABSTRACT:
Diagnostic testing of a charge coupled device is facilitated by interconnecting the reference node of the sense amplifier for each data block in the CCD device with a probe contact on the device, thereby eliminating the need for applying a microprobe to the sensitive reference node. Reference voltages under different operating conditions can be evaluated by measuring the device generated reference voltage or by applying variable reference voltages through the probe contact to the reference node.

REFERENCES:
patent: 3795859 (1974-03-01), Benante et al.
patent: 4336495 (1982-06-01), Hapke
Hwang, "Indirect Measurement of Sense Amplifier Unbalance in Dynamic RAM", IBM Tech. Disc. Bul., vol. 23, No. 7A, 12/80, pp. 2906-2907.

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