Static information storage and retrieval – Read/write circuit – Testing
Patent
1981-02-19
1983-10-11
Hecker, Stuart N.
Static information storage and retrieval
Read/write circuit
Testing
324158T, G11C 2900
Patent
active
044096763
ABSTRACT:
Diagnostic testing of a charge coupled device is facilitated by interconnecting the reference node of the sense amplifier for each data block in the CCD device with a probe contact on the device, thereby eliminating the need for applying a microprobe to the sensitive reference node. Reference voltages under different operating conditions can be evaluated by measuring the device generated reference voltage or by applying variable reference voltages through the probe contact to the reference node.
REFERENCES:
patent: 3795859 (1974-03-01), Benante et al.
patent: 4336495 (1982-06-01), Hapke
Hwang, "Indirect Measurement of Sense Amplifier Unbalance in Dynamic RAM", IBM Tech. Disc. Bul., vol. 23, No. 7A, 12/80, pp. 2906-2907.
Fairchild Camera & Instrument Corporation
Hecker Stuart N.
Olsen Kenneth
Pollock Michael J.
Silverman Carl L.
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