Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-07
2008-11-04
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07448004
ABSTRACT:
A method, management tool, or spreadsheet device that allows a user to analyze, compare, and assess various aspects of an electronic design validation process for an integrated circuit. The exemplary method provides a six-sigma measurement of the effectiveness of an electronic design validation process. Furthermore, various different types of electronic design validation processes can be compared and contrasted for their effectiveness for validating the electronic design throughout the design process.
REFERENCES:
patent: 6651228 (2003-11-01), Narain et al.
patent: 2005/0149311 (2005-07-01), McGaughy
patent: 2005/0278576 (2005-12-01), Hekmatpour
Chiang Jack
Hoffman Bernard S.
Memula Suresh
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