Method and equipment for simulation

Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system

Reexamination Certificate

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Details

C716S030000

Reexamination Certificate

active

07577556

ABSTRACT:
The simulation equipment has division unit for dividing a layout of a photo mask (mask layout) into a plurality of areas, average light intensity value calculation unit for calculating an average value of light intensity in each of the areas, smoothing unit for subjecting the calculated average value to smoothing processing, and multiplication unit for multiplying the smoothed average value by a predetermined multiplier.

REFERENCES:
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patent: 6171731 (2001-01-01), Medvedeva et al.
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Andreas Erdmann et al.; “Enhancements in Rigorous Simulation of Light Diffraction from Phase Shift Masks”, 2002, Proceedings of SPIE, vol. 4691, pp. 1156-1167.
Chris A. Mack; “Measuring and Modeling Flare in Optical Lithography”, Jun. 2003, Optical Microlithography XVI, Proceedings of the SPIE, vol. 5040, pp. 151-161.
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Teruyoshi Yao et al.; “Local Flare Effects and Correction in ArF Lithography”, Jun. 2003, 2003 Symposium on VLSI Technology Digest of Technical Papers, pp. 43-44.
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Morimi Osawa et al.; “Correction for local flare effects approximated with double Gaussian profile in ArF lithography”, Dec. 2003, Journal of Vacuum Science and Technology B, vol. 21, No. 6, pp. 2806-2809.
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Patent Abstracts of Japan, Publication No. 2001-272766 dated Oct. 5, 2001./Discussed in the specification.

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