Method and equipment for plasma processing

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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427574, 427569, 117103, H01L 21306

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active

054013569

ABSTRACT:
The amount of dust particles deposited on a semiconductor wafer during plasma etching or CVD in manufacturing a semiconductor integrated circuit is decreased by second plasma generating electrode 28 disposed around a lower electrode 15 in a plasma etching chamber 4a. High frequency voltage is applied to the second plasma generating electrode 18 just before the stop of plasma discharge to form a sub-plasma of high density along the outer periphery of the lower electrode 15, there is formed a sub-potential distribution acting to push out negatively charged dust particles stagnating near the main surface of a semiconductor substrate 7 toward the outer periphery of the wafer. The negatively charged dust particles thus pushed out from the vicinity of the main surface of the wafer 7 are moved to the second plasma generating electrode 28 and exhausted by a vacuum pump through an exhaust port 25.

REFERENCES:
patent: 4401054 (1983-08-01), Matsuo et al.
patent: 4421592 (1983-12-01), Shuskus et al.
patent: 4962727 (1990-10-01), Harada
patent: 5017835 (1991-05-01), Oeschsner
patent: 5221425 (1993-06-01), Blanchard et al.
patent: 5259881 (1993-11-01), Edwards et al.
patent: 5273586 (1993-12-01), Kim et al.
SPIE Proceedings, Oct., 1989, vol. 1185, "Dry Processing for submicrometer Lithography", Bondur et al, pp. 86-97.

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