Method and device to determine interplanar distances in electron

Details Method and device to determine interplanar distances in electron Method and device to determine interplanar distances in electron

1982-07-26

1984-10-30

Anderson, Bruce G.

Radiant energy

Inspection of solids or liquids by charged particles

250311, G01N 2300

Patent

active

044801882

ABSTRACT:
The invention relates to a method and device that make it possible to determine interplanar distances in electron diffraction images in electron microscopes. This is done through its beam stopper, which originally was used only to interrupt the central beam for better display of the diffraction image.
The invention makes possible the elimination of errors normally committed in determining said distances, many of them related to the deformation of the film and to unsuitably exposed photographs.

REFERENCES:
patent: 2619598 (1952-11-01), Coltman et al.
patent: 4316087 (1982-02-01), Yanaka et al.

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