Method and device of analyzing crosstalk effects in an...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

07469391

ABSTRACT:
For analyzing the effects of crosstalk in an electronic device, a model description of the electronic device is provided which defines a victim net and at least one aggressor net, the model description allowing for simulating the dynamic response behaviour at an output of the victim net with respect to an input signal of the victim net and/or of the at least one aggressor net. A characteristic property of the response behaviour at the output of the victim net is represented as an output function of the simulation, the value of the output function depending on input parameters of the simulation. The output function is evaluated as to find an extremum of the output function in a preset range of the input parameters. The characteristic property may in particular be a measure of the delay of the output signal of the victim net with respect to the input signal of the victim net, the input parameters corresponding to the timing of a signal transition applied to the input of the at least one aggressor net with respect to the timing of a signal transition applied to the input of the victim net.

REFERENCES:
patent: 6253359 (2001-06-01), Cano et al.
patent: 6327542 (2001-12-01), McBride
patent: 6370674 (2002-04-01), Thill
patent: 6378109 (2002-04-01), Young et al.
patent: 6732065 (2004-05-01), Muddu
patent: 6772403 (2004-08-01), Sasaki
patent: 6799153 (2004-09-01), Sirichotiyakul et al.
patent: 2002/0193959 (2002-12-01), Wanek et al.
patent: 2003/0115557 (2003-06-01), Elzinga
Sirichotiyakul et al., “Driver Modeling and Alignment for Worst-Case Delay Noise,” Proceedings of the 38thAnnual Design Automation Conference, Jun. 2001, pp. 720-725, (6 pages).
Lauren Hui Chen et al., “Aggressor Alignment for Worst-Case Coupling Noise,”, Proceedings International Symposium on Physical Design, Apr. 2000, pp. 48-54, (7 pages).

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