4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

H.ang.kan Ohlsson

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Method and device for tightness control of a joint

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method and device for tightness control of a joint

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Refrigeration system and a separator therefor

Gas separation: apparatus – Degasifying means for liquid – Pressure reducing means
Patent

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Refrigeration system and a separator therefor

Refrigeration – Automatic control – Refrigeration producer
Patent

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Profile ID: LFUS-PAI-P-338085

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