Method and device for testing configuration memory cells in...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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Details

C365S230090, C365S221000, C365S219000, C365S220000, C714S742000, C714S733000, C714S725000, C714S763000, C714S819000

Reexamination Certificate

active

10436895

ABSTRACT:
A programmable logic device (PLD) has the ability to test the configuration memory either independently or during configuration. The PLD may include a selector for selecting a particular column or row of the configuration memory array, and an input data storage device for storing configuration data required to be stored in the selected column or row, or test data for testing the selected column or row. The PLD may also include an output data storage device for storing the output from the selected column or row, and test logic that provides control signals for verifying the correct operation of the data lines of the configuration memory array without disturbing the data stored in the memory array.

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