Method and device for signaling a transmission fault on a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S14000D, C324S522000, C375S224000, C714S712000, C714S715000

Reexamination Certificate

active

07137061

ABSTRACT:
A method and a configuration produce a fault signal that is suitable for identifying transmission faults when using differential signaling. A first mid-level signal whose potential is in the area of the mid-point between the signal level on a first signal line and a signal level on a second signal line, when a logic “1” is transmitted is compared with a second mid-level signal formed when a logic “0” is transmitted. The fault signal is produced if the discrepancy between the two mid-level signals is greater than a predetermined threshold value.

REFERENCES:
patent: 5260664 (1993-11-01), Graham
patent: 5368687 (1994-11-01), Sandhu et al.
patent: 5600660 (1997-02-01), Wolf
patent: 5781585 (1998-07-01), Dorner et al.
patent: 6051997 (2000-04-01), Yeung et al.
patent: 6418550 (2002-07-01), Heinrich
patent: 6432779 (2002-08-01), Hobbs et al.
patent: 6538865 (2003-03-01), Nagatani et al.
patent: 6764898 (2004-07-01), En et al.
patent: 2003/0056031 (2003-03-01), Dauerer et al.
patent: 2003/0104706 (2003-06-01), Mitsuhashi et al.
patent: 33 42 763 (1985-06-01), None
patent: 100 37 489 (2002-02-01), None
patent: 05175174 (1993-07-01), None
patent: 2000216142 (2000-08-01), None
patent: WO 2004/021409 (2004-03-01), None
patent: WO 2004/030049 (2004-04-01), None
“Process for Selective Etching of Tantalum Oxide” IBM Technical Disclosure Bullentin, IBM Corp., New York, vol. 27, No. 12 May 1985, p. 7238, XP000807046.
Christenson K., et al. “Selective Wet Etching of High-K Gate Dielectrics” Diffusion and Defect Data, Solid State Data, Part B, Solid State Phenomena, vol. 92, 2003, pp. 129-132, XP008023569.
Bernet J., et al. “Wet Etch Enhancement of HfO2 Films by Implant Processing”, Diffusion and Defect Data, Solid State Data, Part B, Solid State Phenomena, vol. 92, 2003, pp. 11-14 XP008029227.
European Search Report EP 04 01 7225.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and device for signaling a transmission fault on a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for signaling a transmission fault on a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for signaling a transmission fault on a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3702171

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.