Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1995-09-21
1997-07-15
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356 33, G01N 2121
Patent
active
056488505
ABSTRACT:
The invention pertains to a method and a device for carrying out the quality control of an object (10) that comprises at least one transparent layer (18). According to this method and this device, at least one light beam (41) of a light source (42) is projected onto the object (10) at an angle (.alpha.) and is received by at least one photosensitive receiver (53). According to the invention, it is proposed that the light beam that emerges from the object be split before it is projected onto the first photosensitive receiver (53), with part of the light beam being deflected in the direction toward a second photosensitive receiver (62). This measure makes it possible to expose simultaneously two different photosensitive receivers (53, 62) so as to display different defects of an object (10).
REFERENCES:
patent: 3474254 (1969-10-01), Piepenbrink et al.
patent: 4030835 (1977-06-01), Firester et al.
patent: 4381151 (1983-04-01), Smith
patent: 4701052 (1987-10-01), Schoen
patent: 4841510 (1989-06-01), Yoshizawa
patent: 4859062 (1989-08-01), Thurn et al.
patent: 4908508 (1990-03-01), Dubbeldam
patent: 4941138 (1990-07-01), Chida et al.
patent: 5131755 (1992-07-01), Chadwick et al.
patent: 5475667 (1995-12-01), Kamimura et al.
1 page Abstract of DE 3515602 in English Language.
1 page Abstract of DE 3803181 in English Language.
Basler Norbert
Klicker Jurgen
Ley Dietmar
Basler GmbH
Rosenberger Richard A.
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