Static information storage and retrieval – Read/write circuit – Testing
Patent
1982-02-05
1983-12-06
Hecker, Stuart N.
Static information storage and retrieval
Read/write circuit
Testing
365 96, 235492, G11C 1700, G11C 2900
Patent
active
044197470
ABSTRACT:
A method and system for encoding key process and test information in semiconductors is disclosed. The invention is particularly useful in connection with byte-wide memories, but also finds application in a wide range of semiconductor devices. A plurality of programmable memory cells are juxtaposed on a semiconductor die with the circuitry which performs the primary function of the chip. The programmable memory cells are interconnected with the primary circuit in such a manner that the information programmed and stored therein can be accessed only when such access does not interfere with the operation of the primary circuit. Important product processing and test information is stored in the programmable cells such as wafer number, lot number, processing parameters, special visual and test results and manufacturing rework data.
REFERENCES:
patent: 3712537 (1973-01-01), Carita
patent: 3872452 (1975-03-01), Stoops
patent: 4344155 (1982-08-01), Mollier
Wahler, "Using Fusible Links to Apply Machines Readable Serial Numbers to Printed-Circuit Boards," IBM Tech. Disc. Bul., vol. 20. No. 6, 11/77, p. 2286.
Hecker Stuart N.
Seeq Technology Inc.
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