Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate
2008-05-20
2008-05-20
Vanore, David (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron probe type
C250S305000, C250S306000, C250S307000, C250S370090, C250S492300, C250S492100, C250S492200, C378S044000, C378S045000, C378S046000, C378S050000
Reexamination Certificate
active
07375327
ABSTRACT:
A method and device to accurately obtain very small quantity of wear of the order of nanometers of a protective film on the surface of a sliding member. A quantity of wear on the surface of a measurement sample including a base and a coating layer is measured by making a spectrum of the surface elements in a reference sample using a surface-element analysis device which analyzes elements on the surface of a substance from an energy spectrum of charged particles obtained by applying excited ionization radiation on the reference sample equivalent to the measurement and by measuring charged particles generated from the surface of the substance. A step of obtaining signal intensity ratios of plural elements from the spectrum is repeated a plurality of times while the surface of the reference sample is being etched and calibration curves which indicate a distribution of the signal intensity ratios of the plural elements in the reference sample are made. Subsequently, an energy spectrum of charged particles from the surface of the measurement sample is measured, signal intensity ratios of specific elements are calculated and compared with the calibration curves to determine a quantity of wear of the measurement sample.
REFERENCES:
patent: 4597093 (1986-06-01), Fischer
patent: 4799246 (1989-01-01), Fischer
patent: 5061562 (1991-10-01), Yamanaka et al.
patent: 5750747 (1998-05-01), Furutani et al.
patent: 5776602 (1998-07-01), Ueda et al.
patent: 5982847 (1999-11-01), Nelson
patent: 6110330 (2000-08-01), Lin et al.
patent: 6512810 (2003-01-01), Haszler et al.
patent: 6558822 (2003-05-01), Nagasaka et al.
patent: 6611576 (2003-08-01), Besser et al.
patent: 6631177 (2003-10-01), Haszler et al.
patent: 6668039 (2003-12-01), Shepard et al.
patent: 6859517 (2005-02-01), Wilson et al.
patent: 7184515 (2007-02-01), Wilson
patent: 2001/0038894 (2001-11-01), Komada
patent: 2002/0017235 (2002-02-01), Nagasaka et al.
patent: 2003/0094085 (2003-05-01), Ueda et al.
patent: 2003/0128805 (2003-07-01), Shepard et al.
patent: 2004/0011957 (2004-01-01), Yoshiki et al.
patent: 2006/0011865 (2006-01-01), Migeon et al.
patent: 2006/0067465 (2006-03-01), Wilson
patent: 2006/0108545 (2006-05-01), Yoshiki et al.
patent: 2006/0223718 (2006-10-01), Bastien et al.
patent: 2-108949 (1990-04-01), None
patent: 2001-343227 (2001-12-01), None
P. Lemoine, et al., J.Vac. Sci. Technol. A, vol. 17, No. 1, pp. 176-182, “Continuity and Topography of Ultrathin Diamond-Like Carbon Films Characterized by Scanning Electron Microscopy/Energy Dispersive X-Ray Analysis and Atomic Force Microscopy,” Jan./Feb. 1999.
R.H..Wang, et al., IEEE Transactions on Magnetics, vol. 38, No. 5, pp. 2132-2134, “Head-Disk Interface Considerations at 10-nm Flying Height,” Sep. 2002.
Royston Paynter, “Basic principles of x-ray photoelectron spectroscopy,” dated Jan. 14, 1998, http://www.inrsener uquebec.ca/commerce/xps-tech.html.
“Auger Electron Spectroscopy,” dated Apr. 5, 1997, http://www.chem.qmw.ac.uk/surfaces/scc/scat5-2.htr.
Kato Makoto
Yoshiki Masahiko
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Souw Bernard
Vanore David
LandOfFree
Method and device for measuring quantity of wear does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for measuring quantity of wear, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring quantity of wear will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2777300