Method and device for improved data valid window in response...

Static information storage and retrieval – Read/write circuit – Data transfer circuit

Reexamination Certificate

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Details

C365S194000, C365S211000, C327S176000

Reexamination Certificate

active

07430140

ABSTRACT:
A memory architecture and a method of operating the same can provide a substantially constant data valid window (DVW) irrespective of a temperature for the memory device. Generally, a memory device can receive an access request, determine a temperature of the memory device, and switch a number of delay elements in an output buffer in response to the temperature of the memory device. In one embodiment, a memory device can have a multi-stage input-output (I/O) buffer and an automatic temperature compensated circuit that samples a temperature of the memory and then switches a number of delay elements in the I/O buffer into a data path between the memory and the output to provide a substantially constant DVW over changes in temperature.

REFERENCES:
patent: 5402389 (1995-03-01), Flannagan et al.
patent: 5498977 (1996-03-01), Pickup
patent: 5656947 (1997-08-01), Opris
patent: 5917353 (1999-06-01), Teel
patent: 6215726 (2001-04-01), Kubo
patent: 6294937 (2001-09-01), Crafts et al.
patent: 6369652 (2002-04-01), Nguyen et al.
patent: 7173501 (2007-02-01), Varricchlone
patent: 2002/0099987 (2002-07-01), Corbin et al.

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