Drying and gas or vapor contact with solids – Process – Gas or vapor contact with treated material
Reexamination Certificate
2008-05-27
2008-05-27
Lu, Jiping (Department: 3749)
Drying and gas or vapor contact with solids
Process
Gas or vapor contact with treated material
C034S487000, C034S410000, C134S021000, C134S095300, C134S902000
Reexamination Certificate
active
07377053
ABSTRACT:
A device for drying substrate comprising a processing vessel housing a specified number of substrates such as semiconductor wafers installed erectedly in parallel to one another, a first substrate supporting member supporting substrates within the processing vessel, the processing fluid supplying section supplying to the processing vessel, the processing fluid for performing processing such as cleaning processing on the substrates, a processing fluid exhausting section exhausting processing fluid from the processing vessel, and a drying fluid supplying section supplying, to the processing vessel, the liquid drops of drying fluid for performing drying processing on the substrates.
REFERENCES:
patent: 4816081 (1989-03-01), Mehta et al.
patent: 5653045 (1997-08-01), Ferrell
patent: 5685086 (1997-11-01), Ferrell
patent: 5772784 (1998-06-01), Mohindra et al.
patent: 5782990 (1998-07-01), Murakami et al.
patent: 5951779 (1999-09-01), Koyanagi et al.
patent: 5954911 (1999-09-01), Bergman et al.
patent: 5964958 (1999-10-01), Ferrell et al.
patent: 5968285 (1999-10-01), Ferrell et al.
patent: 6123900 (2000-09-01), Vellutato
patent: 6152153 (2000-11-01), Takase et al.
patent: 6216709 (2001-04-01), Fung et al.
patent: 6219936 (2001-04-01), Kedo et al.
patent: 6247479 (2001-06-01), Taniyama et al.
patent: 6412501 (2002-07-01), Onoda et al.
patent: 6491045 (2002-12-01), Kamikawa et al.
patent: 59156995 (1984-09-01), None
patent: 6-103686 (1994-12-01), None
patent: 409213672 (1997-08-01), None
patent: 10-189517 (1998-07-01), None
patent: 10-335299 (1998-12-01), None
patent: 11-176796 (1999-07-01), None
patent: 11-345798 (1999-12-01), None
patent: 2000-12505 (2000-01-01), None
Aihara Hiroshi
Izutani Naoaki
Maeda Norio
Matsumoto Takao
Oono Masao
Daikin Industries Ltd.
Global IP Counselors
Lu Jiping
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