Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-29
2008-10-14
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S019000
Reexamination Certificate
active
07437696
ABSTRACT:
A method and a device determine a time response of a digital circuit. The time response is determined as a time difference between a data delay of a data path of the digital circuit, and a clock delay of a clock signal, which causes storage of a data item on the data path, taking into account a check. The check is determined dependent on a data slew of a signal on the data path and a clock slew of the clock signal in such a way that a positive time difference ensures the correct saving of the data item.
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Koch Klaus
Pedron Pierrick
Sanders Birgit
Brinks Hofer Gilson & Lione
Chiang Jack
Infineon - Technologies AG
Levin Naum B
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