Method and device for determining the change in thickness and/or

Optics: measuring and testing – By polarized light examination

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

264 402, B29C 5512

Patent

active

049096303

ABSTRACT:
An interference image of a biaxially stretched film strip 4 is generated optically. Streaks in the film strip are areas of different orientation and/or thickness d which are distinguished from the streakfree areas in the interference image by clearly different intensities. In order to generate the interference image, a light-source 1, a diffuser screen 2 and a polarizer 3 are arranged on one side of the film strip 4, and an analyzer 5 and a filter 6 are arranged on the other side of the film strip 4. The light beam of the light source 1 is polarized by the polarized 3 and, within the film (whose main refractive indices n.sub.1 and n.sub.2 have an angle of 45.degree. or 135.degree. respectively to the polarization plane) is split into two beams, oscillating perpendicularly to one another, which have a path difference .GAMMA.=(n.sub.1 -n.sub.2)d after emerging from the film. Of the light behind the film, in general elliptically polarized, only that portion of the light which oscillates parallel to the analyzer plane, which is perpendicular to the polarization plane, passes through the analyzer 5. In general, a colored interference image is obtained if the light source emits polychromatic light. A detector 7 as light-sensitive element, e.g. a video camera, comprising a light-sensitive diode matrix, which is connected to an image analysis and computing unit 8 for evaluation of the interference image, is arranged behind the filter, which serves to increase the contrast of the image.

REFERENCES:
patent: 3124637 (1964-03-01), Heitzer
patent: 3183763 (1965-05-01), Kuester
patent: 3421820 (1969-01-01), Huebschman
patent: 3446977 (1969-05-01), Bateson
patent: 3466129 (1969-09-01), Agatsuma et al.
patent: 3871771 (1975-03-01), Scott
patent: 4584476 (1986-04-01), Colombotto et al.
patent: 4684487 (1987-08-01), Gawrisch
Trubnyakov et al, "Equipment for Continuously Monitoring the Quality of Film Materials", Meas. Tech, vol. 21, No. 9 (Sep. 1978).
Foppl, Monch "Praktische Spannungsoptik", Berlin 1972, Springer-Verlan, S. 6-17, pp. 192-196.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and device for determining the change in thickness and/or does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for determining the change in thickness and/or, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for determining the change in thickness and/or will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-788787

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.