Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-06-27
2006-06-27
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C324S312000, C324S076190
Reexamination Certificate
active
07069524
ABSTRACT:
To analyze a network of conductors, especially an electrical power supply network, it is planned to measure the spectral (49) and temporal (50) nature of a signal available at a node of the network. An image (49–51) representing this state is produced. This image produced is compared with an expected image (52–55) showing an <<on >> state of one and/or the other of the appliances connected to this network. The state of the appliances, whether on or off, is deduced therefrom. This information can be used to optimize the use of the electrical power or to monitor the activity of the appliances concerned.
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Fernandez Thierry
Garreau Dominique
Boyle Fredrickson Newholm Stein & Gratz S.C.
Dinh Paul
Laboratoire Europeen ADSL Lecom Fastnet
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