Method and deposition system for increasing deposition rates...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S663000, C438S686000, C257SE21170, C257SE21021, C257SE21311, C257SE21324

Reexamination Certificate

active

10996144

ABSTRACT:
A method and a deposition system for increasing deposition rates of metal layers from metal-carbonyl precursors using CO gas and a dilution gas. The method includes providing a substrate in a process chamber of a processing system, forming a process gas containing a metal-carbonyl precursor vapor and a CO gas, diluting the process gas in the process chamber, and exposing the substrate to the diluted process gas to deposit a metal layer on the substrate by a thermal chemical vapor deposition process. The deposition system contains a substrate holder configured for supporting and heating a substrate in a process chamber having a vapor distribution system, a precursor delivery system configured for forming a process gas containing a metal-carbonyl precursor vapor and a CO gas and for introducing the process gas to the vapor distribution system, a dilution gas source configured for adding a dilution gas to the process gas in the process chamber, and a controller configured for controlling the deposition system during exposure of the substrate to the diluted process gas to deposit a metal layer on the substrate by a thermal chemical vapor deposition process.

REFERENCES:
patent: 4929468 (1990-05-01), Mullendore
patent: 4938999 (1990-07-01), Jenkin
patent: 6303809 (2001-10-01), Chi et al.
patent: 6319832 (2001-11-01), Uhlenbrock et al.
patent: 6440495 (2002-08-01), Wade et al.
patent: 6444263 (2002-09-01), Paranjpe et al.
patent: 6605735 (2003-08-01), Kawano et al.
patent: 6713373 (2004-03-01), Omstead
patent: 6989321 (2006-01-01), Yamasaki et al.
patent: 7078341 (2006-07-01), Yamasaki et al.
patent: 2003/0129306 (2003-07-01), Wade et al.
patent: 2004/0105934 (2004-06-01), Chang et al.
patent: 2005/0081882 (2005-04-01), Greer et al.
patent: 2005/0110142 (2005-05-01), Lane et al.
patent: 2005/0186341 (2005-08-01), Hendrix et al.
patent: 0620291 (1994-10-01), None
patent: WO0026432 (2000-05-01), None
patent: WO2005034223 (2005-04-01), None
Wang et al.; Low-temperature chemical vapor deposition and scaling limit of ultrathin Ru films, Applied Physics Letters, Feb. 23, 2004, pp. 1380-1382, vol. 84, No. 8, American Institute of Physics, Melville, NY.
European Patent Office, International Search Report and Written Opinion, Aug. 8, 2006, 10 pp.
European Patent Office, International Search Report and Written Opinion of corresponding PCT Application No. PCT/US2006/007675, dated Oct. 13, 2006, 9 pages.

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