Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-15
2005-11-15
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06966045
ABSTRACT:
A wire load estimating method comprises (1) reading a netlist; (2) generating connection information including the names of signals, the identification names and the names of pins of instances which include cells, macro blocks and synthesized blocks as described in the netlist; (3) dividing an area of a chip into two or more regions and determining connection point coordinates for each of the regions by the use of the connection information and locations of the instances as placed; (4) determining a wiring path by the use of the connection point coordinates; and (5) estimating a wire capacitance value and a wire resistance value with reference to the wiring path.
REFERENCES:
patent: 5790841 (1998-08-01), Scherer et al.
patent: 5987086 (1999-11-01), Raman et al.
patent: 6266803 (2001-07-01), Scherer et al.
patent: 6510542 (2003-01-01), Kojima
patent: HEI 07-105240 (1995-04-01), None
Do Thuan
Holmes Brenda O.
Kabushiki Kaisha Toshiba
Kilpatrick & Stockton LLP
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