Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-11-16
2010-11-02
Shah, Kamini S (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C714S006130, C714S010000, C714S011000, C714S030000, C714S733000, C714S734000
Reexamination Certificate
active
07827018
ABSTRACT:
A method and computer program for selecting circuit repairs using redundant elements with consideration of aging effects provides a mechanism for raising short-term and long-term performance of memory arrays beyond present levels/yields. Available redundant elements are used as replacements for selected elements in the array. The elements for replacement are selected by BOL (beginning-of-life) testing at a selected operating point that maximizes the end-of-life (EOL) yield distribution as among a set of operating points at which post-repair yield requirements are met at beginning-of-life (BOL). The selected operating point is therefore the “best” operating point to improve yield at EOL for a desired range of operating points or maximize the EOL operating range. For a given BOL repair operating point, the yield at EOL is computed. The operating point having the best yield at EOL is selected and testing is performed at that operating point to select repairs.
REFERENCES:
patent: 2006/0203581 (2006-09-01), Joshi et al.
patent: 2007/0141731 (2007-06-01), Hemink et al.
patent: 2007/0220455 (2007-09-01), Joshi et al.
Adams Chad A.
Joshi Rajiv V.
Kanj Rouwaida N.
Nassif Sani R.
Alhija Saif A
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris Atty at Law, LLC
Shah Kamini S
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