Method and circuit for determining sense amplifier sensitivity

Details Method and circuit for determining sense amplifier sensitivity Method and circuit for determining sense amplifier sensitivity

2005-03-01

2005-03-01

Nguyen, Viet Q. (Department: 2818)

Static information storage and retrieval

Read/write circuit

Testing

C365S205000, C365S207000, C365S190000, C365S202000, C365S196000

Reexamination Certificate

active

06862233

ABSTRACT:
A dynamic random access memory (DRAM) includes a bit line pair, including a first bit line and a second bit line. Memory cells and a sense amplifier are coupled to the bit lines. A first characterization cell is coupled between the first bit line and a first reference supply line. The first characterization cell includes a capacitor. Similarly, a second characterization cell is coupled between the first bit line and the first reference supply line. The second characterization cell also includes a capacitor but preferably with a different capacitance. In the preferred embodiment, similar characterization cells are coupled to the second bit line.

REFERENCES:
patent: 4504929 (1985-03-01), Takemae et al.
patent: 5010524 (1991-04-01), Fifield et al.
patent: 5184326 (1993-02-01), Hoffmann et al.
patent: 5305261 (1994-04-01), Furutani et al.
patent: 5361232 (1994-11-01), Petschauer et al.
patent: 5381364 (1995-01-01), Chern et al.
patent: 5418750 (1995-05-01), Shiratake et al.
patent: 5428574 (1995-06-01), Kuo et al.
patent: 5532963 (1996-07-01), Kushiyama et al.
patent: 5880988 (1999-03-01), Bertin et al.
patent: 5917744 (1999-06-01), Kirihata et al.
patent: 6067263 (2000-05-01), Brady
patent: 6088286 (2000-07-01), Yamauchi et al.
patent: 6097650 (2000-08-01), Brede et al.
patent: 6104650 (2000-08-01), Shore
patent: 6137712 (2000-10-01), Röhr et al.
patent: 6236607 (2001-05-01), Schlager et al.
patent: 6275434 (2001-08-01), Yamada et al.
patent: 6339550 (2002-01-01), Wanlass
patent: 6418044 (2002-07-01), Laurent
patent: 6434055 (2002-08-01), Tanaka et al.
patent: 6480435 (2002-11-01), Nakamura et al.
patent: 6643164 (2003-11-01), Laurent
patent: 6643180 (2003-11-01), Ikehashi et al.
patent: 20040052126 (2004-03-01), Laurent

Affiliated with

Also associated with

Rating

Method and circuit for determining sense amplifier sensitivity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and circuit for determining sense amplifier sensitivity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and circuit for determining sense amplifier sensitivity will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3421494