Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-08-30
2011-08-30
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S005110, C714S006130, C714S025000, C714S029000, C714S036000, C714S042000, C714S048000, C714S054000, C714S718000, C714S719000, C714S723000, C714S736000, C714S742000, C714S745000, C714S818000, C711S100000, C711S101000, C711S102000, C711S103000, C711S104000, C365S185010, C365S185200, C365S185240, C365S185330, C365S200000
Reexamination Certificate
active
08010854
ABSTRACT:
Detecting brown-out in a system having a non-volatile memory (NVM) includes loading data in the NVM, wherein a next step in loading is performed on a location in the NVM that is logically sequential to an immediately preceding loading. A pair of adjacent locations include one with possible data and another that is empty. Determining which of the two, if at all, have experienced brownout includes using two different sense references. One has a higher standard for detecting a logic high and the other higher standard for detecting a logic low. Results from using the two different references are compared. If the results are the same for both references, then there is no brownout. If the results are different for either there has been a brownout. The location with the different results is set to an invalid state as the location that has experienced the brownout.
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Lattermann Jochen
McGinty Stephen F.
Scouller Ross S.
Chiu Joanna G.
Clingan, Jr. James L.
Freescale Semiconductor Inc.
Trimmings John P
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