Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-01
2006-08-01
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07086021
ABSTRACT:
A method of extracting capacitance for a first wire segment is disclosed. The method approximates a non orthogonal first section of interconnect wiring containing the first wire segment by using an orthogonal second section of interconnect wiring. The method determines an estimated capacitance of the non orthogonal first section of interconnect wiring by using the orthogonal second section of interconnect wiring. The method adds a correction factor to the estimated capacitance to generate a modeled capacitance value for the non orthogonal first section of interconnect wiring.
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Chatterjee Arindam
Teig Steven
Cadence Design Systems Inc.
Lin Sun James
Stattler Johansen & Adeli LLP
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