Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-11-16
2010-02-23
Fahmy, Wael (Department: 2814)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257S758000, C438S639000
Reexamination Certificate
active
07666783
ABSTRACT:
In a method of contacting terminals, a substrate having a first terminal and a second terminal is provided, a terminal surface of the first terminal being located at a shorter distance from a substrate surface than a surface of the second terminal. A first insulating layer, in which a contact via is formed for exposing the terminal surface of the first terminal, is formed on the substrate surface. The contact via is filled with a conductive material, and a second insulating layer is formed on the first insulating layer and on the contact via filled with the conductive material. Using an etching mask, a first recess for exposing the conductive material filling the contact via, and a second recess are etched through the second and first insulating layers for exposing the second terminal surface. A conductive material for producing first and second contact terminals is introduced into the first and second recesses. This is to achieve that the second terminal is contacted in the production of the second contact terminal.
REFERENCES:
patent: 5451543 (1995-09-01), Woo et al.
patent: 5760429 (1998-06-01), Yano et al.
patent: 5891799 (1999-04-01), Tsui
patent: 5943598 (1999-08-01), Lin
patent: 6087724 (2000-07-01), Shields et al.
patent: 6214727 (2001-04-01), Parekh
patent: 6239491 (2001-05-01), Pasch et al.
patent: 6492731 (2002-12-01), Catabay et al.
patent: 6815328 (2004-11-01), Pio
patent: 6836019 (2004-12-01), Yang et al.
Goller Klaus
Reb Alexander
Schwalbe Grit
Fahmy Wael
Infineon - Technologies AG
Kalam Abul
Maginiot, Moore & Beck
LandOfFree
Method and arrangement for contacting terminals does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and arrangement for contacting terminals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and arrangement for contacting terminals will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4178629