Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2006-03-07
2006-03-07
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C414S936000, C250S206100, C356S622000, C702S150000
Reexamination Certificate
active
07008802
ABSTRACT:
A method and apparatus is provided for determining workpiece drift from its nominal or intended position. The apparatus includes two proportionate sensors, each of which gives an output reading that depends upon how much of the sensor beam is blocked by an edge of the workpiece. A computer can calculate positional drift based upon these readings. Also disclosed is a method for aligning proportionate sensors to be parallel to one another.
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Knobbe Martens Olson & Bear LLP
Pert Evan
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