Method and apparatus to analyze noise in a pulse logic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

07107552

ABSTRACT:
A method and apparatus to analyze noise in a pulse logic digital circuit comprising identifying a channel connected component (CCC) in the pulse logic digital circuit design, said CCC comprising a pulse generator. Modifying the pulse logic digital circuit by disconnecting the pulse generator form an input of the CCC in the pulse logic digital circuit design. Turning on the pulse logic digital circuit, inputting a noise signal to the CCC and monitoring an output of the pulse logic digital circuit during the time the pulse logic digital circuit is turn on.

REFERENCES:
patent: 6389578 (2002-05-01), McBride
patent: 6496031 (2002-12-01), Keller et al.
patent: 6526552 (2003-02-01), Bosnyak et al.
patent: 6539527 (2003-03-01), Naffziger et al.
patent: 6556962 (2003-04-01), Patra
patent: 6594805 (2003-07-01), Tetelbaum et al.
patent: 6711722 (2004-03-01), Parashkevov et al.
patent: 2002/0194573 (2002-12-01), Keller et al.
patent: 2004/0164769 (2004-08-01), Sung et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus to analyze noise in a pulse logic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus to analyze noise in a pulse logic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus to analyze noise in a pulse logic... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3571517

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.