Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1997-09-30
2000-11-28
Picardat, Kevin M.
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
438 4, 438 14, 216 58, 216 59, H01L 2358
Patent
active
061538914
ABSTRACT:
A method and an apparatus providing a circuit edit structure to an integrated circuit enabling circuit edits to be performed through the back side of an integrated circuit die. In one embodiment, a passive diffusion is disposed in the substrate of a flip-chip packaged integrated circuit die. A plurality of contacts couple the passive diffusion to a signal line disposed in a dielectric isolation layer of the integrated circuit die. In another embodiment, the signal line includes an uninterrupted length of approximately 3.0 microns beneath a field oxide region in the integrated circuit die, which provides a circuit edit cut location. The passive diffusion and circuit edit cut locations may be accessed through the back side of the flip-chip packaged integrated circuit, which enable circuit edits to be performed on the flip-chip packaged integrated circuit.
REFERENCES:
patent: 4632724 (1986-12-01), Chesebro et al.
patent: 4650744 (1987-03-01), Amano
patent: 4732646 (1988-03-01), Elsner et al.
patent: 5037771 (1991-08-01), Lipp
patent: 5064498 (1991-11-01), Miller
patent: 5268065 (1993-12-01), Grupen-Shemansky
patent: 5438166 (1995-08-01), Carey et al.
patent: 5701666 (1997-12-01), DeHaven et al.
patent: 5838625 (1998-11-01), Cutter et al.
patent: 5840627 (1998-11-01), Huggins
patent: 5843844 (1998-12-01), Miyanaga
patent: 5844295 (1998-12-01), Tsukude et al.
patent: 5904486 (1999-05-01), Livengood et al.
patent: 5948217 (1999-09-01), Winer et al.
patent: 5976980 (1999-11-01), Livengood et al.
patent: 6001703 (1999-12-01), Winer et al.
Paul Winer, "IC Failure Analysis, E-Beam Tutorial," International Reliability and Physics Symposium, 1996.
Scott Silverman, "Laser Microchemical Technology Enables Real-Time Editing of First-Run Silicon," Solid State Technology, 1996.
Ann N. Campbell, Fault Localization with the Focused Ion Beam (FIB) System, in Microelectronic Failure Analysis, ASM International, 1996.
Intel Corporation
Picardat Kevin M.
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