Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-07-07
2009-06-02
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07541818
ABSTRACT:
In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of long and short measurement distances between the probe and the DUT are set, and measurement at the long measurement distance and measurement at the short measurement distance are performed plural times. Herein, the measurement at the short measurement distance is performed on a received band where electromagnetic interference is measured by the measurement at the long measurement distance. Thus, measurement of electromagnetic interference can be performed with high accuracy in a short time.
REFERENCES:
patent: 6456070 (2002-09-01), Kazama et al.
patent: 6696834 (2004-02-01), Kou et al.
Ikeda Kazuhiko
Kajiwara Shoichi
Kosaka Hirofumi
Tani Hiroyuki
Ueda Yoichiro
Nguyen Ha Tran T
Nguyen Tung X
Panasonic Corporation
Steptoe & Johnson LLP
LandOfFree
Method and apparatus of electromagnetic measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus of electromagnetic measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus of electromagnetic measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4122340