Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-01-30
2009-08-18
Kwok, Helen C. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07574903
ABSTRACT:
A method of operating a scanning probe microscope includes using a probe having a cantilever, and oscillating the probe at a torsional resonance frequency thereof. In addition, the method includes substantially increasing torsional drive efficiency with dual actuators disposed on the probe or the probe base. First and second actuators may be driven by corresponding first and second drive signals, the first and second drive signals being about 180° out of phase. The maximizing step includes altering at least one of the amplitudes of the first and second drive signals to maximize torsional oscillation. Torsional and flexural oscillation of the cantilever probe can be excited concurrently, sequentially or independently by adjusting the phase of the corresponding drive signals. A pair of cantilever components can be used to form a nanotweezer by rotating the respective arms having corresponding tip portions at the distal ends.
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Takayoshi Kawagishi, Atsushi Kato, Yasuo Hoshi, Hideki Kawakatsu,Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever, Ultramicroscopy, 2002, p. 37-48, 91, Elvesier Science B. V.
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Daniels Robert C.
Su Chanmin
Boyle Fredrickson , S.C.
Kwok Helen C.
Veeco Instruments Inc.
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