Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-12-27
2009-10-20
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S001000
Reexamination Certificate
active
07607116
ABSTRACT:
A method for performing verification on a Transaction Level (TL) model having at least two abstraction levels in simulation modeling for design of a System-on-Chip (SoC). The TL model verification method includes acquiring first request information and first response information; acquiring second request information and second response information; dividing the first and second request information and the first and second response information; comparing the divided first and second request information and comparing the divided first and second response information; and verifying a modeling result on the TL model depending on the comparison results.
REFERENCES:
patent: 2006/0282233 (2006-12-01), Pasricha et al.
patent: 2008/0263486 (2008-10-01), Alexanian et al.
Levin Naum B
Samsung Electronics Co,. Ltd
The Farrell Law Firm, LLP
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