Method and apparatus for validating system properties...

Details Method and apparatus for validating system properties... Method and apparatus for validating system properties...

2011-04-19

2011-04-19

Chu, Gabriel L (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S045000

Reexamination Certificate

active

07930597

ABSTRACT:
The invention includes a method and apparatus for validating system properties exhibited in execution traces. In one embodiment, a method for testing a system under test (SUT) includes determining a system testing result for the SUT using at least one structured term generated by monitoring an execution trace of the SUT using at least one parameterized pattern. A test procedure is executed for the SUT. The test procedure has at least one parameterized pattern associated therewith. An execution trace generated during execution of the test procedure is parsed, where the execution trace includes unstructured information and the execution trace is parsed using the at least one parameterized pattern to identify at least one matching pattern. A system testing result for the SUT is determined using at least one structured term that is generated using the at least one matching pattern. In this manner, behavior of the system under test during the test procedure may be validated.

REFERENCES:
patent: 4483002 (1984-11-01), Groom et al.
patent: 5548719 (1996-08-01), DeVane et al.
patent: 6266789 (2001-07-01), Bucher et al.
patent: 7200588 (2007-04-01), Srivastava et al.
patent: 7836346 (2010-11-01), Davidov et al.
patent: 2003/0088853 (2003-05-01), Iida et al.
patent: 2003/0110419 (2003-06-01), Banerjee et al.
patent: 2004/0254919 (2004-12-01), Giuseppini
patent: 2005/0028157 (2005-02-01), Betancourt et al.
patent: 2006/0129871 (2006-06-01), Smith
patent: 2006/0184529 (2006-08-01), Berg et al.

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