Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-03-20
2000-05-16
Le, Vu A.
Static information storage and retrieval
Read/write circuit
Testing
36518523, 36523006, G11C 700
Patent
active
060646101
ABSTRACT:
A method and apparatus for using a supply signal, rather than a programming signal, to test bitline stress and multicolumn programming in semiconductor memory devices is disclosed. The memory device includes a bitline driver that controls the voltage on the bitline. The method has the step of generating a programming signal and a supply signal. Both the programming signal and the supply signal are suitable for powering the memory device. The supply signal is provided to the bitline driver during the test-programming of the memory device. The memory device includes a bitline driver circuit which provides an output to a data line. The circuit isolates the programming signal from the data line, and the supply signal is placed in electrical communication with the data line.
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Le Vu A.
Micro)n Technology, Inc.
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